rev 16Sep04 pdf
aka Wafer Level Reliability Workshop
|
rev 16Sep04 pdf aka Wafer Level Reliability Workshop |
The Integrated Reliability Workshop focuses on ensuring semiconductor reliability through component fabrication, design, characterization, and analysis tools. It provides a unique environment for envisioning, developing, and sharing reliability technology for present and future semiconductor applications. Hot reliability topics of the workshop are: Cu-interconnects & low-k dielectrics, reliability of deep sub-micron, high speed, high frequency devices (e.g. SiGe), SOI devices, reliability modeling & simulation, and the reliability of future technologies such as molecular electronics and carbon nanotubes.
For ordering IRW Final Reports (printed, 1992-2003; CD-r, 1998-2003 ) Past Final Reports order form
(ref. only) 2004 IRW Call for Papers